Silicon-Based Films and Methods of Forming the Same

ABSTRACT

Disclosed herein are containing silicon-based films and compositions and methods for forming the same. The silicon-based films contain &lt;50 atomic % of silicon. In one aspect, the silicon-based films have a composition Si x C y N Z  wherein x is about 0 to about 55, y is about 35 to about 100, and z is about 0 to about 50 atomic weight (wt.) percent (%) as measured by XPS. In another aspect, the silicon-based films were deposited using at least one organosilicon precursor comprising two silicon atoms, at least one Si-Me group, and an ethylene or propylene linkage between the silicon atoms such as 1,4-disilapentane.

CROSS REFERENCE TO RELATED APPLICATIONS

This application is a divisional of U.S. application Ser. No.14/924,098, filed on Oct. 27, 2015, which, in turn, claims the benefitof priority under 35 U.S.C. § 119(e) to U.S. provisional application No.62/074,219, filed on Nov. 3, 2014, the disclosures of which are herebyincorporated by reference in their entirety.

BACKGROUND OF THE INVENTION

Disclosed herein are silicon-containing or silicon-based dielectricfilms or materials, and methods and compositions of forming the same.

The silicon-based dielectric films described herein include, but notlimited to, non-stoichiometric silicon carbide, amorphous silicon,silicon carbonitride, or silicon nitride for use in various electronicapplications. In certain embodiments, the dielectric films include otherelements besides silicon and carbon. These other elements may sometimesbe intentionally added into the compositional mixture via the depositionprocess depending upon the resultant application of the film or desiredend-properties.

For example, the element nitrogen (N) may be added to the silicon-basedfilms to form a carbonitride or silicon nitride film to provide acertain dielectric performance such as, without limitation, a lowerleakage current. Depending upon the application, however, certainelements in the film may be undesirable even at lower concentrationlevels.

Silicon carbide films are typically deposited using the precursor1,4-disilabutane (1,4-DSB). US Publ. No. 2010/233886 described methodsof forming silicon-based films comprising Si, such as, but not limitedto, Si oxide, Si oxycarbide, Si carbide, and combinations thereof, thatexhibit at least one of the following characteristics: low wet etchresistance, a dielectric constant of 6.0 or below, and/or can withstanda high temperature, rapid thermal anneal process.

While the prior art has disclosed the use of 1,4-disilabutane asprecursor for chemical vapor deposition (CVD) of silicon-containingfilms such as, silicon carbide films with silicon content higher thanabout 55% according to X-ray photoelectron spectroscopy (XPS), there isa need to deposit silicon carbide films or materials having a siliconcontent less than about 55%. It is believed that the reason that the SiCfilms deposited from 1,4-disilabutane had a silicon content greaterthan >55% Si was because the Si was bound to itself forming Si—Si bonds.These Si—Si bonds make the film susceptible to damage during subsequentprocess integration steps such as, for example, exposure to O₂ plasmatreatment or ashing. Hence, there is a need in the art to providedevelop alternative precursors and methods using same to provide siliconcontaining films where the silicon content of the film is less thanabout 55% as measured by XPS. It is also desirable to have robust filmsof high density (a density of 2 grams/cubic centimeter (g/cc) orgreater) to withstand further processing steps during integration.

BRIEF SUMMARY OF THE INVENTION

The compositions and methods described herein fulfill one or more of theneeds in the art. Described herein are methods and precursors forforming silicon-based dielectric materials or films comprising silicon,carbon, optionally nitrogen, and combinations thereof. In certainembodiments, the silicon-based films are substantially free of oxygen,or, alternatively, comprise from about 0 to about 11 atomic weightpercent of oxygen as measured by X-ray photoelectron spectroscopy (XPS).In one aspect, the silicon-based films have the compositionSi_(x)C_(y)N_(z) wherein x is about 0 to about 55, y is about 35 toabout 100, and z is about 0 to about 50 atomic weight (wt.) percent (%)as measured by XPS. In another aspect, the silicon-based films have acomposition SixC_(y) wherein x is about 0 to about 55 and y is about 35to about 100 atomic wt. %. In this or other aspects, the silicon-basedfilms described herein contain about 55 atomic wt. % of silicon or lessas measured by X-ray photoelectron spectroscopy (XPS). The atomic wt. %of carbon and optionally nitrogen in the silicon-based films can betuned by changing deposition conditions such as temperature, adding anitrogen source, or combinations thereof while maintaining about 55atomic wt. % of silicon or less in the material or film.

In one aspect, there is provided a method for forming a silicon-basedfilm on at least a portion of the surface of a substrate, the methodcomprising:

providing the substrate in a reactor;

introducing at least one organosilicon precursor compound having thefollowing Formulae A through D into the reactor:

wherein X¹ and X² are each independently selected from a hydrogen atom,a halide atom, and an organoamino group having the formula NR¹R² whereinR¹ is selected from a linear C₁ to C₁₀ alkyl group, a branched C₃ to C₁₀alkyl group, a cyclic C₃ to C₁₀ alkyl group, a linear or branched C₃ toC₁₀ alkenyl group, a linear or branched C₃ to C₁₀ alkynyl group, a C₁ toC₆ dialkylamino group, an electron withdrawing group, and a C₆ to C₁₀aryl group and R² is selected from a hydrogen atom, a linear C₁ to C₁₀alkyl group, a branched C₃ to C₁₀ alkyl group, a cyclic C₃ to C₁₀ alkylgroup, a linear or branched C₃ to C₆ alkenyl group, a linear or branchedC₃ to C₆ alkynyl group, a C₁ to C₆ dialkylamino group, a C₆ to C₁₀ arylgroup, a linear C₁ to C₆ fluorinated alkyl group, a branched C₃ to C₆fluorinated alkyl group, an electron withdrawing group, and a C₄ to C₁₀aryl group and optionally wherein R¹ and R² are linked together to forma ring selected from a substituted or unsubstituted aromatic ring or asubstituted or unsubstituted aliphatic ring; R³, R⁴, and R⁵ are eachindependently selected from a hydrogen atom and a methyl (CH₃) group;and R⁶ is selected from a hydrogen atom, a linear C₁ to C₁₀ alkyl group,a branched C₃ to C₁₀ alkyl group, a cyclic C₃ to C₁₀ alkyl group, alinear or branched C₃ to C₁₀ alkenyl group, a linear or branched C₃ toC₁₀ alkynyl group, a C₁ to C₆ dialkylamino group, an electronwithdrawing group, and a C₆ to C₁₀ aryl group; and

forming the film on the at least a portion of the surface by adeposition process selected from a group consisting of chemical vapordeposition (CVD), low pressure chemical vapor deposition (LPCVD), plasmaenhanced chemical vapor deposition (PECVD), cyclic chemical vapordeposition (CCVD), plasma enhanced cyclic chemical vapor deposition(PECCVD, atomic layer deposition (ALD), and plasma enhanced atomic layerdeposition (PEALD) wherein the silicon-based film comprise from about 0to about 50 atomic weight percent silicon as measured by XPS. In oneaspect, the deposition process comprises LPCVD. In another aspect, thedeposition process comprises PECVD. Yet, in another aspect, thedeposition process comprises PEALD or PECCVD.

In another aspect, there is provided a composition for depositing asilicon-based film; the composition comprising:

at least one organosilicon precursor comprising two silicon atomsselected from the group consisting of 1-chloro-1,4-disilapentane,1-chloro-1,5-disilahexane, 1,5-dichloro-1,5-disilahexane,2,6-dichloro-2,6-disilaheptane, 1-dimethylamino-1,4-disilapentane,1-diethylamino-1,4-disilapentane,1-di-iso-propylamino-1,4-disilapentane,1-dimethylamino-1,5-disilahexane, 1-diethylamino-1,5-disilahexane,1-di-iso-propylamino-1,5-disilahexane, 2-dimethylamino-2,5-disilahexane,2-diethylamino-2,5-disilahexane, 2-di-iso-propylamino-2,5-disilahexane,2-dimethylamino-2,6-disilaheptane, 2-diethylamino-2,6-disilaheptane,2-di-iso-propylamino-2,6-disilaheptane,1,4-bis(dimethylamino)-1,4-disilapentane,1 ,4-bis(diethylamino)-1,4-disilapentane,1,5-bis(dimethylamino)-1,5-disilahexane,1,5-bis(diethylamino)-1,5-disilahexane,2,5-bis(dimethylamino)-2,5-disilahexane,2,5-bis(diethylamino)-2,5-disilahexane,2,6-bis(dimethylamino)-2,6-disilaheptane,2,6-bis(diethylamino)-2,6-disilaheptane,1,2-dimethyl-1-aza-2,5-disilacyclopentane,1-n-propyl-2-methyl-1-aza-2,5-disilacyclopentane,1-iso-propyl-2-methyl-1-aza-2,5-disilacyclopentane,1-tert-butyl-2-methyl-1-aza-2,5-disilacyclopentane,1,2-dimethyl-1-aza-2,6-disilacyclohexane,1-n-propyl-2-methyl-1-aza-2,6-disilacyclohexane,1-iso-propyl-2-methyl-1-aza-2,6-disilacyclohexane,1-tert-butyl-2-methyl-1-aza-2,5-disilacyclohexane, 1,2,5-trimethyl-1-aza-2,5-disilacyclopentane,1-n-propyl-2,5-dimethyl-1-aza-2,5-disilacyclopentane,1-iso-propyl-2,5-dimethyl-1-aza-2,5-disilacyclopentane,1-tert-butyl-2,5-dimethyl-1-aza-2,5-disilacyclopentane,1,2,6-trimethyl-1-aza-2,6-disilacyclohexane,1-n-propyl-2,6-dimethyl-1-aza-2,6-disilacyclohexane,1-iso-propyl-2,6-dimethyl-1-aza-2,6-disilacyclohexane, and1-tert-butyl-2,6-dimethyl-1-aza-2,6-disilacyclohexane.

DETAILED DESCRIPTION OF THE INVENTION

Described herein are silicon-based dielectric films, and methods andcompositions for forming the same. Throughout the description, the term“silicon based film” and “dielectric film” as used herein areinterchangeably and refers to a film comprising silicon, carbon andoptionally nitrogen and hydrogen (which may be present in the film butnot measurable by XPS) selected from the group consisting ofstoichiometric or non-stoichiometric silicon carbide, siliconcarbonitride, and mixture thereof. In certain embodiments, thesilicon-based films are oxygen-free or “substantially free” of oxygen.In these embodiments, the term “substantially free” as used herein meansa film that comprises 2 atomic weight % (at. wt. %) or less, or 1 at.wt. % or less, or 0.5 at. wt. 5 or less of oxygen as measured by XPS.

The silicon-based dielectric films exhibit at least one or more of thefollowing characteristics: relatively lower wet etch rate as compared tothermal silicon oxide (such as when exposed to dilute HF); lower leakagecurrent; good within wafer uniformity which uniformity can be obtainedby measurement on different areas of the wafers (e.g. 5 point map) andstandard deviation calculation; conformality; resistance to gas phaseprocesses (such as, for example, oxidative plasmas); and combinationsthereof. With regard to the later characteristics, the silicon-basedfilms exhibits relatively little to no change in properties and filmstructure compared to thermal silicon oxide. In addition to theforegoing, the silicon-based films provide one or more of the followingadvantages: high thermal stability (e.g. ability to withstand a spikeanneal processing step wherein the subject is subjected to one or moretemperatures ranging from about 600 - 1000° C.), environmental stability(e.g. exhibiting little change or 10% or less, 5% or less, 2% or less,or 1% or less change in refractive index (RI) or other film propertiesafter 1-24 hour exposure to ambient), adjustable composition includingcarbon-rich films (C and/or N doped amorphous silicon-based film with<50 atomic % of Si and carbon content is equal or greater that the Sicontent), and combinations thereof.

In one particular embodiment, the silicon-based films described hereinexhibit a low etch rate (or non measurable etch rate), a high density(e.g., having a film density of 2.0 g/cc or greater), reduced amount ofSi—Si bonds (e.g., <5% of total bonding as measured by Ramanspectroscopy), and a Si less than 50% atomic wt. % measured by XPS.

In integration processing, photoresist stripping is an indispensablestep. The photoresist removal is commonly implemented using an oxygen(O₂) plasma dry ashing step. The properties of the silicon-containingdielectric films adjacent to the photoresist may be degraded during theO₂ plasma treatment. Common problems that are encountered are one ormore of the following: oxidation of the films, loss of carbon, filmshrinkage, film densification, and/or increased moisture absorption inthe film post stripping. These effects can be measured by one or more ofthe following: a change in the refractive index (RI) of the filmmeasured by its value before and after ashing; a decreased carboncontent as shown by the reduction in C at. wt. % in the film as measuredby XPS; a higher dielectric constant (k) value compared to itspre-ashing k value; a higher density measurement compared to itspre-ashing density measurement; and a lower film thickness post-ashingcompared to its pre-ashing thickness measurement. It is expected thatfilms of high density (e.g., 2 g/cc or greater) and good Si—C—Si carbidebonding (seen by the peak at ˜800 cm-1 in the FTIR spectra) will providebetter oxygen ashing resistance.

The silicon-containing dielectric films described herein exhibit + or−20% or less, 15% or less, 10% or less, 5% or less, 2% or less change inone or more of the following characteristics: refractive index,dielectric constant, density, thickness, wet etch resistance, filmthickness, or combinations thereof when comparing the samecharacteristics before or after an oxygen ashing processing step, atemperature spike anneal process, and/or exposure ranging from 1 to 24hours of ambient air.

The silicon-containing dielectric films described herein are depositedfrom compositions comprising a organosilicon precursor compoundcomprising at two silicon atoms, at least one Si-Me group, and an atleast one C₂ or C₃ linkage. The C₂ or C₃ linkage is a diradical chainselected from the group consisting of an alkane-1,2-diyl, analkane-1,3-diyl. Examples of alkane-1,2-diyl andalkane-1,3-diyldiradical chains include, but not limited to, ethylene(—CH₂CH₂—), substituted ethylene (—CHMeCH₂—, —CH(Me)CH(Me)—), propylene(—CH₂CH₂CH₂—), and substituted propylene. Examples of the organosiliconcompounds include 1,4-disilapentane (“1,4-DSP”) and other organosiliconcompounds with similar structures. Silicon-based dielectric filmsdeposited from the precursors described herein have shown to have uniquefilm properties over other precursors such as 1-4-disilabutane(“1,4-DSB”), such as being carbon-rich (e.g., have greater than 40atomic % of C), and the ability to adjust the Si, C content in siliconcarbide films or to tune Si, C, and N content in the resultant siliconcarbonitride film.

To form dielectric films comprising silicon, carbon, and optionallynitrogen, it is, in certain embodiments, desirable that theorganosilicon precursor is free of oxygen. It is also desirable, incertain embodiments, that the precursors be reactive enough to deposit afilm at a relatively low temperature (e.g., 600° C. or less). Despite adesire for precursor reactivity, the precursor should also be stableenough to not degrade or change to any significant extent over time(e.g., less than 1% change per year). The organosilicon compoundsdescribed herein, such as without limitation 1,4-DSP, with an ethyleneor propylene bridge between silicon atoms have special tendency tocleave the C—Si bonds at high temperature. When one silicon group breaksfrom the ethylene bridge, a free radical or a cation is formed on thebridge-head carbon atom. Another silicon placed on the beta-positionprovides stabilization to the radical or cation throughhyperconjugation, that is, a filled delta-orbital of Si—C bond donateselectrons to the empty or single occupancy p-orbital. This is also knownas beta-silicon effect. This hyper-conjugated intermediate furtherdecomposes with the breakage of the second Si—C bond. The net result iselimination of ethylene or propylene bridge as volatile byproduct, andgeneration of chemically reactive silicon species some of which haveSi-Me group, consequently reacting with other reactive silicon speciesto deposit silicon based films on substrate. Not bound by any theory,the Si-Me can be incorporated into the resulting silicon based films,thus providing higher carbon content than comparable films depositedfrom 1,4-disilabutane which does not have any Si-Me group.

In one aspect, the composition for depositing a dielectric filmcomprising silicon, carbon, and optionally nitrogen film comprises: atleast one organosilicon compound having the following Formulae A throughD:

In Formulae A-D above, X¹ and X² are each independently selected from ahydrogen atom, a halide atom, and an organoamino group having theformula NR¹R² wherein R¹ is selected from a linear C₁ to C₁₀ alkylgroup, a branched C₃ to C₁₀ alkyl group, a cyclic C₃ to C₁₀ alkyl group,a linear or branched C₃ to C₁₀ alkenyl group, a linear or branched C₃ toC₁₀ alkynyl group, a C₁ to C₆ dialkylamino group, an electronwithdrawing group, and a C₆ to C₁₀ aryl group and R² is selected from ahydrogen atom, a linear C₁ to C₁₀ alkyl group, a branched C₃ to C₁₀alkyl group, a cyclic C₃ to C₁₀ alkyl group, a linear or branched C₃ toC₆ alkenyl group, a linear or branched C₃ to C₆ alkynyl group, a C₁ toC₆ dialkylamino group, a C₆ to C₁₀ aryl group, a linear C₁ to C₆fluorinated alkyl group, a branched C₃ to C₆ fluorinated alkyl group, anelectron withdrawing group, and a C₄ to C₁₀ aryl group and optionallywherein R¹ and R² are linked together to form a ring selected from asubstituted or unsubstituted aromatic ring or a substituted orunsubstituted aliphatic ring; R³, R⁴, and R⁵ are each independentlyselected from a hydrogen atom and a methyl (CH₃) group; and R⁶ isselected from a hydrogen atom, a linear C₁ to C₁₀ alkyl group, abranched C₃ to C₁₀ alkyl group, a cyclic C₃ to C₁₀ alkyl group, a linearor branched C₃ to C₁₀ alkenyl group, a linear or branched C₃ to C₁₀alkynyl group, a C₁ to C₆ dialkylamino group, an electron withdrawinggroup, and a C₆ to C₁₀ aryl group.

In the formulae described herein and throughout the description, theterm “linear alkyl” denotes a linear functional group having from 1 to10 or 3 to 6 carbon atoms. Exemplary linear alkyl groups include, butare not limited to, methyl (Me), ethyl (Et), propyl (n-Pr), iso-propyl(iso-Pr or ^(i)Pr), butyl (n-Bu), isobutyl (^(s)Bu), sec-butyl (^(s)Bu),tert-butyl (^(t)Bu), pentyl, iso-pentyl, tert-pentyl (amyl), hexyl,iso-hexyl, and neo-hexyl. In the formulae described herein andthroughout the description, the term “branched alkyl” denotes a branchedfunctional group having from 3 to 10 or 3 to 6 carbon atoms. Exemplarybranched alkyl groups include, but are not limited to, iso-propyl(iso-Pr or ^(i)Pr), isobutyl (^(s)Bu), sec-butyl (^(s)Bu), tert-butyl(^(t)Bu), iso-pentyl, tert-pentyl (amyl), iso-hexyl, and neo-hexyl.

In the formulae described herein and throughout the description, theterm “cyclic alkyl” denotes a cyclic functional group having from 3 to10 or from 4 to 10 carbon atoms or from 5 to 10 carbon atoms. Exemplarycyclic alkyl groups include, but are not limited to, cyclobutyl,cyclopentyl, cyclohexyl, and cyclooctyl groups.

In the formulae described herein and throughout the description, theterm “aryl” denotes an aromatic cyclic functional group having from 5 to12 carbon atoms or from 6 to 10 carbon atoms. Exemplary aryl groupsinclude, but are not limited to, phenyl, benzyl, chlorobenzyl, tolyl,and o-xylyl.

In the formulae described herein and throughout the description, theterm “alkenyl group” denotes a group which has one or more carbon-carbondouble bonds and has from 3 to 10 or from 3 to 6 or from 3 to 4 carbonatoms.

In the formulae described herein and throughout the description, theterm “alkynyl group” denotes a group which has one or more carbon-carbontriple bonds and has from 3 to 10 or from 3 to 6 or from 3 to 4 carbonatoms.

In the formulae described herein and throughout the description, theterm “dialkylamino group” denotes a group which has two alkyl groupsattached to a nitrogen atom and has from 2 to 10 or from 2 to 6 or from2 to 4 carbon atoms.

In the formulae described herein and throughout the description, theterm “electron withdrawing group” as used herein describes an atom orgroup thereof that acts to draw electrons away from the Si-N bond.Examples of suitable electron withdrawing groups or substituentsinclude, but are not limited to, nitriles (CN). In certain embodiments,electron withdrawing substituent can be adjacent to or proximal to N inany one of Formulae A-D. Further non-limiting examples of an electronwithdrawing group includes F, Cl, Br, I, CN, NO₂, RSO, and/or RSO₂wherein R can be a C₁ to C₁₀ alkyl group such as, but not limited to, amethyl group or another group.

In the formulae above and through the description, the term“unsaturated” as used herein means that the functional group,substituent, ring or bridge has one or more carbon double or triplebonds. An example of an unsaturated ring can be, without limitation, anaromatic ring such as a phenyl ring. The term “saturated” means that thefunctional group, substituent, ring or bridge does not have one or moredouble or triple bonds.

In certain embodiments, one or more of the alkyl group, alkenyl group,alkynyl group, dialkylamino group, aryl group, and/or electronwithdrawing group may be substituted or have one or more atoms or groupof atoms substituted in place of, for example, a hydrogen atom.Exemplary substituents include, but are not limited to, oxygen, sulfur,halogen atoms (e.g., F, Cl, I, or Br), nitrogen, and phosphorous. Inother embodiments, one or more of the alkyl group, alkenyl group,alkynyl group, dialkylamino aryl group, and/or electron withdrawinggroup may be unsubstituted.

In certain embodiments, R¹ and R² in the precursor are the organominogroup NR¹R² and are linked in Formulae A-B to form a ring structure. Inthese embodiments, R² is not a hydrogen atom. For example, in anembodiment where R¹ and R^(2 are) linked together to form a ring, R² hasan unsaturated bond (instead of a hydrogen substituent) for linking toR¹. Thus, in the example above R² may be selected from a C₁ to C₁₀alkenyl moiety or a linear or branched C₁ to C₁₀ alkynyl moiety. Inthese embodiments, the ring structure of the compound can be unsaturatedsuch as, for example, a cyclic alkyl ring, or saturated, for example, anaryl ring. Further, in these embodiments, the ring structure can also besubstituted or substituted. In one particular embodiment, theorganosilicon compound comprises an aliphatic, substituted ring such asa heteratomic cyclic functional group having from 5 to 10 carbon atomsand at least one nitrogen atom. Exemplary organomino groups NR¹R²wherein R¹ and R² are linked in Formulae A-B to form a ring structureinclude, but are not limited to, 2,6-dimethylpiperidino, piperidino,2-methyl-pyrrolidino, 2,5-dimethyl-pyrrolidino. In other embodiments, R¹and R² are not linked in Formulae A-B.

In certain embodiments, the organosilicon precursor compound has FormulaA described herein. Exemplary compounds of these particular embodimentsinclude, but are not limited to: 1-chloro-1,4-disilapentane,1,4-dichloro-1,4-disilapentane, 1-dimethylamino-1,4-disilapentane,1-diethylamino-1,4-disilapentane, 1-methylethylamino-1,4-disilapentane,1-di-n-propylamino-1,4-disilapentane,1-di-iso-propylamino-1,4-disilapentane,1-iso-propylamino-1,4-disilapentane, 1-sec-butylamino-1,4-disilapentane,1-tert-butylamino-1,4-disilapentane,1-(2,6-dimethylpiperidino)-1,4-disilapentane,1-piperidino-1,4-disilapentane,1-(cyclohexyl-iso-propylamino)-1,4-disilapentane,1-(n-propyl-iso-propylamino)-1,4-disilapentane,1,4-bis(dimethylamino)-1,4-disilapentane,1,4-bis(diethylamino)-1,4-disilapentane,1,4-bis(methylethylamino)-1,4-disilapentane,1,4-bis(di-n-propylamino)-1,4-disilapentane,1,4-bis(di-iso-propylamino)-1,4-disilapentane,1,4-bis(iso-propylamino)-1,4-disilapentane,1,4-bis(sec-butylamino)-1,4-disilapentane,bis(tert-butylamino)-1,4-disilapentane,1,4-bis(2,6-dimethylpiperidino)-1,4-disilapentane,1,4-bis(piperidino)-1,4-disilapentane,1,4-bis(cyclohexyl-iso-propylamino)-1,4-disilapentane,1,4-bis(n-propyl-iso-propylamino)-1,4-disilapentane,2-chloro-2,5-disilahexane,2,5-dichloro-disilahexane, 2-dimethylamino-2,5-disilahexane,2-diethylamino-2,5-disilahexane, 2-methylethylamino-2,5-disilahexane,2-di-n-propylamino-2,5-disilahexane,2-di-iso-propylamino-2,5-disilahexane,2-iso-propylamino-2,5-disilahexane, 2-sec-butylamino-2,5-disilahexane,2-tert-butylamino-2,5-disilahexane,2-(2,6-dimethylpiperidino)-2,5-disilahexane,2-piperidino-2,5-disilahexane,2-(cyclohexyl-iso-propylamino)-2,5-disilahexane,2-(n-propyl-iso-propylamino)-2,5-disilahexane,2,5-bis(dimethylamino)-2,5-disilahexane,2,5-bis(diethylamino)-2,5-disilahexane,2,5-bis(methylethylamino)-2,5-disilahexane,2,5-bis(di-n-propylamino)-2,5-disilahexane,2,5-bis(di-iso-propylamino)-2,5-disilahexane,2,5-bis(iso-propylamino)-2,5-disilahexane,2,5-bis(sec-butylamino)-2,5-disilahexane,2,5-bis(tert-butylamino)-2,5-disilahexane,2,5-bis(2,6-dimethylpiperidino)-2,5-disilahexane,2,5-bis(1-piperidino)-2,5-disilahexane,2,5-bis(cyclohexyl-iso-propylamino)-2,5-disilahexane,2,5-bis(n-propyl-iso-propylamino)-2,5-disilahexane, and combinationsthereof.

In certain embodiments, the organosilicon precursor compound has FormulaB described herein. Exemplary compounds of these particular embodimentsinclude, but are not limited to: 1-chloro-1,5-disilahexane,1,5-dichloro-1,5-disilahexane, 1-dimethylamino-1,5-disilahexane,1-diethylamino-1,5-disilahexane, 1-methylethylamino-1,5-disilahexane,1-di-n-propylamino-1,5-disilahexane,1-di-iso-propylamino-1,5-disilahexane,1-iso-propylamino-1,5-disilahexane, 1-sec-butylamino-1,5-disilahexane,1-tert-butylamino-1,5-disilahexane,1-(2,6-dimethylpiperidino)-1,5-disilahexane,1-piperidino-1,5-disilahexane,1-(cyclohexyl-iso-propylamino)-1,5-disilahexane,1-(n-propyl-iso-propylamino)-1,5-disilahexane,1,5-bis(dimethylamino)-1,5-disilahexane,1,5-bis(diethylamino)-1,5-disilahexane,1,5-bis(methylethylamino)-1,5-disilahexane,1,5-bis(di-n-propylamino)-1,5-disilahexane,1,5-bis(di-iso-propylamino)-1,5-disilahexane,1,5-bis(iso-propylamino)-1,5-disilahexane,1,5-bis(sec-butylamino)-1,5-disilahexane,1,5-bis(tert-butylamino)-1,5-disilahexane,1,5-bis(2,6-dimethylpiperidino)-1,5-disilahexane,1,5-bis(1-piperidino)-1,5-disilahexane,1,5-bis(cyclohexyl-iso-propylamino)-1,5-disilahexane,1,5-bis(n-propyl-iso-propylamino)-1,5-disilahexane,2-chloro-2,6-disilaheptane, 2,6-dichloro-disilaheptane,2-dimethylamino-2,6-disilaheptane, 2-diethylamino-2,6-disilaheptane,2-methylethylamino-2,6-disilaheptane,2-di-n-propylamino-2,6-disilaheptane,2-di-iso-propylamino-2,6-disilaheptane, 2-iso-propylamino-2,6-disilaheptane, 2-sec-butylamino-2,6-disilaheptane,2-tert-butylamino-2,6-disilaheptane,2-(2,6-dimethylpiperidino)-2,6-disilaheptane,2-piperidino-2,6-disilaheptane,2-(cyclohexyl-iso-propylamino)-2,6-disilaheptane,2-(n-propyl-iso-propylamino)-2,6-disilaheptane,2,6-bis(dimethylamino)-2,6-disilaheptane,2,6-bis(diethylamino)-2,6-disilaheptane,2,6-bis(methylethylamino)-2,6-disilaheptane,2,6-bis(di-n-propylamino)-2,6-disilaheptane,2,6-bis(di-iso-propylamino)-2,6-disilaheptane,2,6-bis(iso-propylamino)-2,6-disilaheptane,2,6-bis(sec-butylamino)-2,6-disilaheptane,2,6-bis(tert-butylamino)-2,6-disilaheptane,2,6-bis(2,6-dimethylpiperidino)-2,6-disilaheptane,2,6-bis(1-piperidino)-2,6-disilaheptane,2,6-bis(cyclohexyl-iso-propylamino)-2,6-disilaheptane,2,6-bis(n-propyl-iso-propylamino)-2,6-disilaheptane, and combinationsthereof.

In certain embodiments, the organosilicon precursor compound has FormulaC described herein. Exemplary compounds of these particular embodimentsinclude, but are not limited to:1,2-dimethyl-1-aza-2,5-disilacyclopentane,1-n-propyl-2-methyl-1-aza-2,5-disilacyclopentane,1-iso-propyl-2-methyl-1-aza-2,5-disilacyclopentane,1-sec-butyl-2-methyl-1-aza-2,5-disilacyclopentane,1-tert-butyl-2-methyl-1-aza-2,5-disilacyclopentane, 1,2,5-trimethyl-1-aza-2,5-disilacyclopentane,1-n-propyl-2,5-dimethyl-1-aza-2,5-disilacyclopentane,1-iso-propyl-2,5-dimethyl-1-aza-2,5-disilacyclopentane,1-sec-butyl-2,5-dimethyl-1-aza-2,5-disilacyclopentane,1-tert-butyl-2,5-dimethyl-1-aza-2,5-disilacyclopentane, and combinationsthereof.

In certain embodiments, the organosilicon precursor compound has FormulaD described herein. Exemplary compounds of these particular embodimentsinclude, but are not limited to: 2-dimethyl-1-aza-2,6-disilacyclohexane,1-n-propyl-2-methyl-1-aza-2,6-disilacyclohexane,1-iso-propyl-2-methyl-1-aza-2,6-disilacyclohexane,1-sec-butyl-2-methyl-1-aza-2,6-disilacyclohexane,1-tert-butyl-2-methyl-1-aza-2,6-disilacyclohexane,1,2,6-trimethyl-1-aza-2,6-disilacyclohexane,1-n-propyl-2,6-dimethyl-1-aza-2,6-disilacyclohexane,1-iso-propyl-2,6-dimethyl-1-aza-2,6-disilacyclohexane,1-sec-butyl-2,6-dimethyl-1-aza-2,6-disilacyclohexane,1-tert-butyl-2,6-dimethyl-1-aza-2,6-disilacyclohexane, and combinationsthereof.

The method used to form the silicon-containing dielectric films aredeposition processes. Examples of suitable deposition processes for themethod disclosed herein include, but are not limited to, cyclic CVD(CCVD), thermal chemical vapor deposition, plasma enhanced chemicalvapor deposition (“PECVD”), high density PECVD, photon assisted CVD,plasma-photon assisted (“PPECVD”), cryogenic chemical vapor deposition,chemical assisted vapor deposition, hot-filament chemical vapordeposition, CVD of a liquid polymer precursor, deposition fromsupercritical fluids, and low energy CVD (LECVD). In certainembodiments, the films are deposited via atomic layer deposition (ALD),plasma enhanced ALD (PEALD) or plasma enhanced cyclic CVD (PECCVD)process. As used herein, the term “chemical vapor deposition processes”refers to any process wherein a substrate is exposed to one or morevolatile precursors, which react and/or decompose on the substratesurface to produce the desired deposition. As used herein, the term“atomic layer deposition process” refers to a self-limiting (e.g., theamount of film material deposited in each reaction cycle is constant),sequential surface chemistry that deposits films of materials ontosubstrates of varying compositions. Although the precursors, reagentsand sources used herein may be sometimes described as “gaseous”, it isunderstood that the precursors can be either liquid or solid which aretransported with or without an inert gas into the reactor via directvaporization, bubbling or sublimation. In some case, the vaporizedprecursors can pass through a plasma generator. In one aspect, thedeposition process comprises LPCVD.

In another aspect, the deposition process comprises PECVD. The term“reactor” as used herein, includes without limitation, reaction chamberor deposition chamber.

In certain embodiments, the method disclosed herein avoids pre-reactionof the precursors by using ALD or CVD methods that separate theprecursors prior to and/or during the introduction to the reactor. Inthis connection, deposition techniques such as ALD or CVD processes areused to deposit the silicon-containing film. In one embodiment, the filmis deposited via an ALD process by exposing the substrate surfacealternatively to the one or more the silicon-containing precursor,oxygen-containing source, nitrogen-containing source, or other precursoror reagent. Film growth proceeds by self-limiting control of surfacereaction, the pulse length of each precursor or reagent, and thedeposition temperature. However, once the surface of the substrate issaturated, the film growth ceases.

Depending upon the deposition method, in certain embodiments, the one ormore silicon-based precursors may be introduced into the reactor at apredetermined molar volume, or from about 0.1 to about 1000 micromoles.In this or other embodiments, the silicon-based precursor may beintroduced into the reactor for a predetermined time period, or fromabout 0.001 to about 500 seconds.

The deposition methods disclosed herein may involve one or more purgegases. The purge gas, which is used to purge away unconsumed reactantsand/or reaction byproducts, is an inert gas that does not react with theprecursors. Exemplary inert gases include, but are not limited to, Ar,N₂, He, neon, H₂ and mixtures thereof. In certain embodiments, a purgegas such as Ar is supplied into the reactor at a flow rate ranging fromabout 10 to about 2000 sccm for about 0.1 to 1000 seconds, therebypurging the unreacted material and any byproduct that may remain in thereactor.

In certain embodiments, the organosilicon precursor is introduced neat,or without additional reactants or carrier gas, under certain depositionconditions to form a solid. In this or other embodiments, a flow ofargon, nitrogen, and/or other gas may be employed as a carrier gas tohelp deliver the vapor of the at least one silicon-based precursor tothe reaction chamber during the precursor pulsing.

The at least one silicon precursors may be delivered to the reactionchamber such as a CVD or ALD reactor in a variety of ways. In oneembodiment, a liquid delivery system may be utilized. In an alternativeembodiment, a combined liquid delivery and flash vaporization processunit may be employed, such as, for example, the turbo vaporizermanufactured by MSP Corporation of Shoreview, MN, to enable lowvolatility materials to be volumetrically delivered, which leads toreproducible transport and deposition without thermal decomposition ofthe precursor. In liquid delivery formulations, the precursors describedherein may be delivered in neat liquid form, or alternatively, may beemployed in solvent formulations or compositions comprising same. Thus,in certain embodiments the precursor formulations may include solventcomponent(s) of suitable character as may be desirable and advantageousin a given end use application to form a film on a substrate.

The deposition temperature in the reaction chamber ranges from 100° C.to 700° C. Exemplary deposition temperatures include one or more of thefollowing endpoints: 100° C., 150° C., 200° C., 250° C., 300° C., 350°C., 400° C., 450° C., 500° C., 550° C., 600° C., 650° C. and 700° C.Examples of suitable ranges of deposition temperature(s) include withoutlimitation, 100° C. to 400° C., 200° to 450° C., or 300° to 600° C.

In certain embodiments, the pressure during the deposition processwithin the reaction chamber ranges from about 0.5 to about 10 Torr, orfrom about 0.5 to about 2 Torr, or from about 0.5 to about 5 Torr. For aPECVD deposition process, the pressure during the deposition process mayrange from about 2 to about 6 Torr. For a LPCVD deposition process, thepressure during the deposition process may range from about 0.25 isabout 1.25 Torr or about 10 Torr.

Energy is applied to the at least one of the precursor, other non-oxygensources, reducing agent, other precursors or combination thereof toinduce reaction and to form the silicon-based film or coating on thesubstrate. Such energy can be provided by, but not limited to, thermal,plasma, pulsed plasma, helicon plasma, high density plasma, inductivelycoupled plasma, X-ray, e-beam, photon, and remote plasma methods. Incertain embodiments, a secondary RF frequency source can be used tomodify the plasma characteristics at the substrate surface. Inembodiments wherein the deposition involves plasma, the plasma-generatedprocess may comprise a direct plasma-generated process in which plasmais directly generated in the reactor, or alternatively a remoteplasma-generated process in which plasma is generated outside of thereactor and supplied into the reactor.

In a typical ALD, PEALD, CVD or PECCVD process, a substrate such as asilicon oxide substrate is heated on a heater stage in a reactionchamber that is exposed to the precursor initially to allow the complexto chemically adsorb onto the surface of the substrate.

In one aspect, there is provided a method for forming a silicon-basedfilm on at least a portion of the surface of a substrate, the methodcomprising:

providing the substrate in a reactor;

introducing at least one organosilicon precursor compound having thefollowing Formulae A through D into the reactor:

wherein X¹ and X² are each independently selected from a hydrogen atom,a halide atom, and an organoamino group having the formula NR¹R² whereinR¹ is selected from a linear C₁ to C₁₀ alkyl group, a branched C₃ to C₁₀alkyl group, a cyclic C₃ to C₁₀ alkyl group, a linear or branched C₃ toC₁₀ alkenyl group, a linear or branched C₃ to C₁₀ alkynyl group, a C₁ toC₆ dialkylamino group, an electron withdrawing group, and a C₆ to C₁₀aryl group and R² is selected from a hydrogen atom, a linear C₁ to C₁₀alkyl group, a branched C₃ to C₁₀ alkyl group, a cyclic C₃ to C₁₀ alkylgroup, a linear or branched C₃ to C₆ alkenyl group, a linear or branchedC₃ to C₆ alkynyl group, a C₁ to C₆ dialkylamino group, a C₆ to 010 arylgroup, a linear C₁ to C₆ fluorinated alkyl group, a branched C₃ to C₆fluorinated alkyl group, an electron withdrawing group, and a C₄ to C₁₀aryl group and optionally wherein R¹ and R² are linked together to forma ring selected from a substituted or unsubstituted aromatic ring or asubstituted or unsubstituted aliphatic ring; R³, R⁴, and R⁵ are eachindependently selected from a hydrogen atom and a methyl (CH₃) group;and R⁶ is selected from a hydrogen atom, a linear C₁ to C₁₀ alkyl group,a branched C₃ to C₁₀ alkyl group, a cyclic C₃ to C₁₀ alkyl group, alinear or branched C₃ to C₁₀ alkenyl group, a linear or branched C₃ toC₁₀ alkynyl group, a C₁ to C₆ dialkylamino group, an electronwithdrawing group, and a C₆ to C₁₀ aryl group; and

forming the film on the at least a portion of the surface by adeposition process selected from a group consisting of chemical vapordeposition (CVD), low pressure chemical vapor deposition (LPCVD), plasmaenhanced chemical vapor deposition (PECVD), cyclic chemical vapordeposition (CCVD), plasma enhanced cyclic chemical vapor deposition(PECCVD, atomic layer deposition (ALD), and plasma enhanced atomic layerdeposition (PEALD) wherein the silicon-based film comprise from about 0to about 50 atomic weight percent silicon as measured by XPS. In oneaspect, the deposition process comprises LPCVD. In another aspect, thedeposition process comprises PECVD.

In another aspect, there is provided a method for forming asilicon-based film having the formula Si_(x)C_(y)N_(z) wherein x isabout 0 to 55, y is 35 to 100, and z is 0 to 50 atomic weight (wt.)percent (%) as measured by XPS on at least one surface of a substrate,the method comprising:

providing at least one surface of the substrate in a reaction chamber;

introducing at least one organosilicon precursor compound having thefollowing having the following Formulae A through D into the reactor:

wherein X¹ and X² are each independently selected from a hydrogen atom,a halide atom, and an organoamino group having the formula NR¹R² whereinR¹ is selected from a linear C₁ to C₁₀ alkyl group, a branched C₃ to C₁₀alkyl group, a cyclic C₃ to C₁₀ alkyl group, a linear or branched C₃ toC₁₀ alkenyl group, a linear or branched C₃ to C₁₀ alkynyl group, a C₁ toC₆ dialkylamino group, an electron withdrawing group, and a C₆ to C₁₀aryl group and R² is selected from a hydrogen atom, a linear C₁ to C₁₀alkyl group, a branched C₃ to C₁₀ alkyl group, a cyclic C₃ to C₁₀ alkylgroup, a linear or branched C₃ to C₆ alkenyl group, a linear or branchedC₃ to C₆ alkynyl group, a C₁ to C₆ dialkylamino group, a C₆ to C₁₀ arylgroup, a linear C₁ to C₆ fluorinated alkyl group, a branched C₃ to C₆fluorinated alkyl group, an electron withdrawing group, and a C₄ to C₁₀aryl group and optionally wherein R¹ and R² are linked together to forma ring selected from a substituted or unsubstituted aromatic ring or asubstituted or unsubstituted aliphatic ring; R³, R⁴, and R⁵ are eachindependently selected from a hydrogen atom and a methyl (CH₃) group;and R⁶ is selected from a hydrogen atom, a linear C₁ to C₁₀ alkyl group,a branched C₃ to C₁₀ alkyl group, a cyclic C₃ to C₁₀ alkyl group, alinear or branched C₃ to C₁₀ alkenyl group, a linear or branched C₃ toC₁₀ alkynyl group, a C₁ to C₆ dialkylamino group, an electronwithdrawing group, and a C₆ to C₁₀ aryl group; and

optionally introducing a nitrogen-containing precursor selected from thegroup consisting of ammonia, hydrazine, monoalkylhydrazine,dialkylhydrazine, primary amine, secondary amine, tertiary amine, andmixture thereof in the reaction chamber;

optionally introducing a carbon-containing precursor selected from thegroup consisting of ethylene, propylene, acetylene, propyne,cyclohexane, cyclooctane and mixture thereof in the reaction chamber;and

forming the silicon-based film on the at least one surface by adeposition process comprising low pressure chemical vapor deposition(LPCVD). In certain embodiments, the LPCVD deposition is conducted atone or more temperatures ranging from about 200 to about 600° C. Inthese or other embodiments, the atomic wt. % of carbon and nitrogen inthe silicon-based films can be adjusted by changing the LPCVD depositionconditions such as temperature, adding a nitrogen-containing precursor,or combinations thereof.

In yet another embodiment of the method described herein, asilicon-containing film selected from the group consisting of siliconcarbide, silicon nitride and silicon carbonitride, the method comprises:

-   a. placing a substrate into a reactor which is heated to a one or    more temperatures ranging from ambient temperature to about 700° C.;-   b. introducing into the reactor at least one organosilicon precursor    compound having the following having the following Formulae A    through D:

wherein X¹ and X² are each independently selected from a hydrogen atom,a halide atom, and an organoamino group having the formula NR¹R² whereinR¹ is selected from a linear C₁ to C₁₀ alkyl group, a branched C₃ to C₁₀alkyl group, a cyclic C₃ to C₁₀ alkyl group, a linear or branched C₃ toC₁₀ alkenyl group, a linear or branched C₃ to C₁₀ alkynyl group, a C₁ toC₆ dialkylamino group, an electron withdrawing group, and a C₆ to C₁₀aryl group and R² is selected from a hydrogen atom, a linear C₁ to C₁₀alkyl group, a branched C₃ to C₁₀ alkyl group, a cyclic C₃ to C₁₀ alkylgroup, a linear or branched C₃ to C₆ alkenyl group, a linear or branchedC₃ to C₆ alkynyl group, a C₁ to C₆ dialkylamino group, a C₆ to C₁₀ arylgroup, a linear C₁ to C₆ fluorinated alkyl group, a branched C₃ to C₆fluorinated alkyl group, an electron withdrawing group, and a C₄ to C₁₀aryl group and optionally wherein R¹ and R² are linked together to forma ring selected from a substituted or unsubstituted aromatic ring or asubstituted or unsubstituted aliphatic ring; and substituents R³, R⁴,and R⁵ are each independently selected from a hydrogen atom and a methyl(CH₃) group; and R⁶ is selected from a hydrogen atom, a linear C₁ to C₁₀alkyl group, a branched C₃ to C₁₀ alkyl group, a cyclic C₃ to C₁₀ alkylgroup, a linear or branched C₃ to C₁₀ alkenyl group, a linear orbranched C₃ to C₁₀ alkynyl group, a C₁ to C₆ dialkylamino group, anelectron withdrawing group, and a C₆ to C₁₀ aryl group; and

-   c. purging the reactor with a purge gas;-   d. providing a plasma containing source into the reactor to at least    partially react with the at least one organosilicon precursor    compound and deposit the silicon-containing film onto the    substrates; and-   e. purging the reactor with a purge gas.    wherein the steps b through e are repeated until a desired thickness    of the silicon containing film is obtained. In some embodiments, the    plasma containing source may be introduced into the reactor in the    form of at least one nitrogen source and/or may be present    incidentally in the other precursors used in the deposition process.

In the method described above, steps b to e defines one cycle and thecycle(s) can be repeated until the desired thickness of a film isobtained. The thickness of the film ranges from about 0.1 Å to about1000 Å, or from about 0.1 Å to about 100 Å, or from about 0.1 Å to about10 Å.

In certain embodiments, the silicon containing dielectric film comprisesnitrogen. Suitable nitrogen-containing source gases may include, forexample, ammonia, hydrazine, monoalkylhydrazine, dialkylhydrazine,primary amine, secondary amine, tertiary amine, nitrogen plasma,nitrogen/hydrogen, nitrogen/helium, nitrogen/argon plasma, ammoniaplasma, nitrogen/ammonia plasma, ammonia/helium plasma, ammonia/argonplasma, ammonia/nitrogen plasma, NF3 plasma, organoamine plasma, andmixtures thereof. Exemplary monoalkylhydrazine includes, but notlimited, methylhydrazine, tert-butylhydrazine. Exemplary dialkyhydrazineincludes, but not limited, 1,1-dimethylhydrazine. Exemplary primaryamine includes, but not limited, methylamine, ethylamine,iso-propylamine, and tert-butylamine. Exemplary secondary amineincludes, but not limited, dimethylamine, diethylamine, anddi-iso-propylamine. Exemplary tertiary amine includes, but not limited,trimethylamine, triethylamine, and pyridine. In one particularembodiment, the nitrogen containing source does not have hydrogen toavoid introducing more hydrogen into the final silicon nitride and isselected from the group consisting of nitrogen plasma, nitrogen/helium,nitrogen/argon plasma, and combinations thereof.

The carbon-containing precursors can be selected from the groupconsisting of methane, ethane, acetylene, ethylene, propane, propylene,propyne, butane, butylene, butadiene, phenylacetylene, cyclohydrocarbonsuch as cyclopentane, cyclohexane.

In other embodiments, the plasma is selected from the group consistingof hydrogen plasma, helium plasma, neon plasma, argon plasma, xenonplasma, hydrogen/helium plasma, hydrogen/argon plasma and mixturesthereof. For deposition of silicon carbonitride, the nitrogen containingsource can further comprise carbon and is selected from the groupconsisting of organoamine plasma such as methylamine plasma,dimethylamine plasma, trimethylamine plasma, ethylamine plasma,diethylamine plasma, trimethylamine plasma, and ethylenediamine plasma.

It is understood that the steps of the methods described herein may beperformed in a variety of orders, may be performed sequentially orconcurrently (e.g., during at least a portion of another step), and anycombination thereof. The respective step of supplying the precursors andthe other source gases (nitrogen containing source carbon containingsource may be performed by varying the duration of the time forsupplying them to change the stoichiometric composition of the resultingsilicon-based film.

For multi-component silicon-based films, at least one of otherprecursors such as silicon-based precursors, nitrogen-containingprecursors, reducing agents, or other reagents can be alternatelyintroduced into the reactor chamber.

In certain embodiments, the resultant silicon-containing films orcoatings can be exposed to a post-deposition treatment such as, but notlimited to, a plasma treatment, chemical treatment, ultraviolet lightexposure, electron beam exposure, thermal, and/or other treatments toaffect one or more properties of the film. In one particular embodiment,the silicon-based film is subjected at a thermal anneal at one or moretemperatures ranging from about 500 to about 1000° C. In certainembodiments, the silicon-containing films described herein have adielectric constant of 10 or less, 9 or less, 7 or less, 6 or less, or 5or less. However, it is envisioned that films having other dielectricconstants (e.g., higher or lower) can be formed depending upon thedesired end-use of the film. An example of the silicon containing orsilicon-containing film that is formed using the organosiliconprecursors and methods described herein has the formulationSi_(x)C_(y)N_(z) wherein Si ranges from about 51% to about 100% or about55% to about 85%; C ranges from about 0% to about 50% or from about 5%to about 25%; N ranges from about 0% to about 50% or from about 0% to25% atomic percent weight ° A wherein x+y+z=100 atomic weight percent,as determined for example, by XPS or other means.

In yet another aspect, there is described a vessel used to store anddeliver the organosilicon precursor compound having Formulae A through Ddescribed herein. In one particular embodiment, the vessel comprises atleast one pressurizable vessel (preferably of stainless steel) fittedwith the proper valves and fittings to allow the delivery of the atleast one organosilicon precursor to the reactor for a CVD, a LPCVD oran ALD process. In this or other embodiments, the at least oneorganosilicon precursor having at least two SiH₃ groups is provided in apressurizable vessel comprised of stainless steel and the purity of theprecursor is 98% by weight or greater or 99.5% or greater which issuitable for the majority of semiconductor applications. In certainembodiments, such vessels can also have means for mixing the at leastone organosilicon precursor with one or more additional precursor ifdesired. In these or other embodiments, the contents of the vessel(s)can be premixed with an additional precursor. Alternatively, the atleast one organosilicon precursor and/or other precursor can bemaintained in separate vessels or in a single vessel having separationmeans for maintaining the organoaminosilane precursor and otherprecursor separate during storage.

For those embodiments wherein the at least one organosiliconprecursor(s) is used in a composition comprising a solvent and an atleast one organosilicon precursor described herein, the solvent ormixture thereof selected does not react with the silicon precursor. Theamount of solvent by weight percentage in the composition ranges from0.5% by weight to 99.5% or from 10% by weight to 75%. In this or otherembodiments, the solvent has a boiling point (b.p.) similar to the b.p.of the at least one organosilicon or the difference between the b.p. ofthe solvent and the b.p. of the at least one organosilicon precursor is40° C. or less, 30° C. or less, or 20° C. or less, or 10° C. or less.Alternatively, the difference between the boiling points ranges from anyone or more of the following end-points: 0, 10, 20, 30, or 40° C.Examples of suitable ranges of b.p. difference include withoutlimitation, 0 to 40° C., 20° to 30° C., or 10° to 30° C. Examples ofsuitable solvents in the compositions include, but are not limited to,an ether (such as 1,4-dioxane, dibutyl ether), a tertiary amine (such aspyridine, 1-methylpiperidine, 1-ethylpiperidine,N,N′-Dimethylpiperazine, N,N,N′,N′-Tetramethylethylenediamine), anitrile (such as benzonitrile), an alkane (such as octane, nonane,dodecane, ethylcyclohexane), an aromatic hydrocarbon (such as toluene,mesitylene), a tertiary aminoether (such as bis(2-dimethylaminoethyl)ether), or mixtures thereof.

As previously mentioned, the purity level of the at least oneorganosilicon precursor(s) is sufficiently high enough to be acceptablefor reliable semiconductor manufacturing. In certain embodiments, the atleast one organosilicon described herein comprise less than 2% byweight, or less than 1% by weight, or less than 0.5% by weight of one ormore of the following impurities: free amines, free halides or halogenions, and higher molecular weight species. Higher purity levels of theorganosilicon precursor described herein can be obtained through one ormore of the following processes: purification, adsorption, and/ordistillation. The impurities of the organosilicon precursors having atleast two SiH₃ groups can be from the raw materials used, solvent used,side-reaction, or by-products. For examples, 1,4-DSP can be prepared viaeither reduction of 1,1,1,4,4,4-hexachlorodisilabutane or1,4-alkoxydisilabutane in presence of metal hydride or lithium aluminumtetrahydride in a solvent. In certain embodiments, oxygen-containingsolvents such as tetrahydrofuran, gylimes or any other by-products, haveto be removed via purification process to eliminate any potential oxygenincorporation into the resulting silicon-based films. In some case, theby-products can be organosilicon compounds which can be used as dopantto deposit silicon-based films.

The films described herein may be suitable for use as passivation layersor sacrificial layers, such as without limitation, etch stop or hermeticbarriers. The films described herein can also be used in solid stateelectronic devices such as logic, memory, light emitting diodes (LEDs),devices planar, patterned, computer chips, optical devices, magneticinformation storages, coatings on a supporting material or substrate,microelectromechanical systems (MEMS), nanoelectromechanical systems,thin film transistor (TFT), and liquid crystal displays (LCD).

As mentioned previously, the method described herein may be used todeposit a silicon-containing film on at least a portion of a substrate.Examples of suitable substrates include but are not limited to, silicon,SiO₂, Si₃N₄, OSG, FSG, silicon carbide, hydrogenated silicon carbide,silicon nitride, hydrogenated silicon nitride, silicon carbonitride,hydrogenated silicon carbonitride, boronitride, antireflective coatings,photoresists, a flexible substrate, organic polymers, porous organic andinorganic materials, metals such as copper and aluminum, and diffusionbarrier layers such as but not limited to TiN, Ti(C)N, TaN, Ta(C)N, Ta,W, or WN. The films are compatible with a variety of subsequentprocessing steps such as, for example, chemical mechanical planarization(CMP) and anisotropic etching processes.

The following examples illustrate the method for preparing organosiliconprecursors selected from Formulae A-D as well as depositingsilicon-containing films described herein and are not intended to limitit in any way.

WORKING EXAMPLES Example 1 Synthesis of 1-chloro-1,4-disilapentane,4-chloro-1,4-disilapentane, and 1,4-dichloro-1,4-disilapentane.

The reagents 1,4-disilapentane (0.50 g, 4.8 mmol) and tert-butylchloride (0.25 g, 2.7 mmol) were combined in the presence of FeCl3catalyst (less than 0.001 g). After stirring overnight, the reactionmixture was found to contain the following products:1-chloro-1,4-disilapentane, 4-chloro-1,4-disilapentane, and 1,4-dichloro-1,4-disilapentane among other products by GasChromatograph—Mass Spectroscopy (GC-MS) (see Table 1 for mass spectraldata).

Example 2 Synthesis of 1-dimethylamino-1,4-disilapentane,4-dimethylamino-1,4-disilapentane, and1,4-bis(dimethylamino)-1,4-disilapentane.

A solution of LiNMe2 (0.15 g, 2.9 mmol) in THF (2 mL) was quickly addedto 1,4-disilapentane (0.30 g, 2.9 mmol) and stirred overnight. Theresulting light grey slurry was filtered and the colorless filtrate wasfound to contain 1-dimethylamino-1,4-disilapentane,4-dimethylamino-1,4-disilapentane, and1,4-bis(dimethylamino)-1,4-disilapentane as major products by GC-MS (seeTable 1 for mass spectral data).

Example 3 Synthesis of 1-diethylamino-1,4-disilapentane,4-diethylamino-1,4-disilapentane, and1,4-bis(diethylamino)-1,4-disilapentane.

The reagents 1,4-disilapentane (0.22 g, 2.1 mmol) and diethylamine (0.05g, 0.68 mmol) were combined in the presence of Ca[N(SiMe3)2]2 catalyst(0.01 g, 0.03 mmol). Immediate bubbling was observed. After 4 hours, thereaction solution was probed by GC-MS and found to contain1-diethylamino-1,4-disilapentane and 4-diethylamino-1,4-disilapentane asmajor products and 1,4-bis(diethylamino)-1,4-disilapentane as a minorproduct (see Table 1 for mass spectral data).

Example 4 Synthesis of 1-di-iso-propylamino-1,4-disilapentane and4-di-iso-propylamino-1,4-disilapentane.

The reagents 1,4-disilapentane (0.16 g, 1.5 mmol) andN-iso-propylidene-iso-propylamine (0.05 g, 0.50 mmol) were combined andadded to a stirred mixture of (Ph₃P)₃RhCl catalyst (0.02 g, 0.02 mmol)in THF (1 mL). After stirring the reaction overnight, resulting paleorange solution was probed by GC-MS and found to contain1-di-iso-propylamino-1,4-disilapentane and4-di-iso-propylamino-1,4-disilapentane as major products (see Table 1for mass spectral data).

Example 5 Synthesis of 1-tert-butylamino-1,4-disilapentane,4-tert-butylamino-1,4-disilapentane, and1-tert-butyl-2-methyl-1-aza-2,5-dislacyclopentane.

The reagents 1,4-disilapentane (0.50 g, 4.8 mmol) and tert-butylamine(0.35 g, 4.8 mmol) were combined in the presence of Ru₃(C₀)12 catalyst(0.01 g, 0.02 mmol) in THF (1 mL). After stirring the reaction for 3 d,the resulting solution was probed by GC-MS and found to contain1-tert-butylamino-1,4-disilapentane,4-tert-butylamino-1,4-disilapentane, and1-tert-butyl-2-methyl-1-aza-2,5-dislacyclopentane (see Table 1 for massspectral data).

Additional functionalized organosilicon precursors of Formulae A-Ddescribed above were made via similar fashion as Examples 1-5 and werecharacterized by mass spectroscopy (MS). The molecular weight (MW), thestructure, and corresponding major MS fragmentation peaks of each1,4-disilapentane-based precursor are provided in Table 1 to confirmtheir identification.

TABLE 1 Organosilicon precursors having Formulae A-D described above.No. Precursor Name MW Structure MS Peaks 1 1-chloro-1,4-disilapentane138.74

137, 123, 108, 95, 79, 72, 62, 58 2 4-chloro-1,4-disilapentane 138.74

137, 123, 109, 92, 79, 73, 65, 58 3 1,4-dichloro-1,4- disilapentane173.18

171, 157, 144, 129, 107, 92, 79, 63, 58 4 1,4-bis(dimethylamino)-1,4-disilapentane 190.44

189, 173, 158, 146, 130, 117, 100, 86, 74, 59 5 1-diethylamino-1,4-disilapentane 175.42

175, 160, 144, 130, 116, 103, 86, 72, 59 6 4-diethylamino-1,4-disilapentane 175.42

175, 160, 144, 130, 116, 103, 88, 72, 58 7 1,4-bis(diethylamino)-1,4-disilapentane 246.55

246, 231, 217, 201, 187, 174, 160, 144, 130, 116, 100, 86, 72, 58 81-di-iso-propylamino-1,4- disilapentane 203.48

203, 188, 172, 158, 144, 130, 116, 103, 86, 75, 59 94-di-iso-propylamino-1,4- disilapentane 203.48

203, 188, 172, 158, 144, 130, 116, 103, 88, 75, 59 101-tert-butylamino-1,4- disilapentane 175.42

175, 160, 144, 118, 103, 88, 75, 57 11 4-tert-butylamino-1,4-disilapentane 175.42

175, 160, 144, 116, 103, 86, 75, 57 12 1-tert-butyl-2-methyl-1-aza-2,5-dislacyclopentane 173.41

172, 158, 142, 128, 114, 100, 86, 71, 59 13 1-iso-propylamino-2-methyl-1-aza-2,5- dislacyclopentane 159.38

159, 144, 128, 114, 103, 86, 70, 59 14 1-di-n-propylamino-1,4-disilapentane 203.48

203, 174, 158, 144, 130, 116, 103, 75, 59 15 4-di-n-propylamino-1,4-disilapentane 203.48

203, 174, 158, 144, 130, 116, 103, 75, 58 16 1,4-bis(di-n-propylamino)-1,4-disilapentane 302.65

302, 273, 260, 229, 202, 188, 174, 158, 130, 116, 100, 86, 72, 58 171-di-sec-butylamino-1,4- disilapentane 231.53

231, 216, 202, 172, 158, 144, 130, 116, 103, 86, 75, 57 184-di-sec-butylamino-1,4- disilapentane 231.53

231, 216, 202, 172, 158, 144, 128, 116, 103, 86, 72, 57 191-(2,6-dimethylpiperdino)- 1,4-disilapentane 215.49

215, 200, 184, 168, 156, 144, 130, 116, 103, 86, 75, 55 201-(2,6-dimethylpiperdino)- 1,4-disilapentane 215.49

214, 200, 186, 170, 154, 144, 130, 116, 103, 86, 72, 55 21 1,4-bis(2,6-dimethylpiperidino)-1,4- disilapentane 326.68

326, 311, 295, 253, 212, 200, 184, 170, 157, 140, 130, 116, 103, 86, 72,55 22 1-cylohexyl-iso- propylamino-1,4- disilapentane 243.54

243, 228, 212, 200, 184, 172, 158, 144, 130, 116, 103, 86, 75, 55 231-cylohexyl-iso- propylamino-1,4- disilapentane 243.54

243, 228, 200, 172, 158, 144, 130, 116, 103, 86, 75, 55 241,4-bis(cyclohexyl-iso- propylamino)-1,4- disilapentane 382.78

382, 367, 339, 311, 299, 281, 242, 226, 198, 168, 158, 144, 126, 116,98, 83, 70, 55 25 1-n-propyl-iso- propylamino-1,4- disilapentane 203.48

203, 188, 174, 158, 144, 130, 116, 103, 86, 75, 58

Example 6 Low-Pressure Chemical Vapor Deposition—LPCVD

Using a LPCVD furnace manufactured by ATV Inc. of Germany, silicon-basedfilms were deposited using the precursor 1,4-disilabutane (1,4-DSB) or1,4-disilapentane (1,4-DSP) either neat or with one or more reactantsand/or diluents were deposited at various temperatures. The LPCVDreactor is a horizontal hot wall quartz reactor with 3 independenttemperature controlled zones and capable of processing 25 wafers. Theprecursor (and reactant or diluent gas, if any) is injected into thechamber on one side. Delivery of the precursor into the furnace wasthrough vapor draw and used a mass flow controller (MFC) to meter thevapor flow. Typical flow rate was 20-25 sccm of precursor. Precursorflows were also physically verified by measuring the volume of liquidconsumed after the first deposition. Reactor is maintained at a fixedpressure during deposition, 1000 mTorr in this case. All thesilicon-containing films were deposited onto medium resistivity (8-12cm) single crystal silicon wafer substrates. Each deposition consistedof eight (8) test wafers placed in slots 2, slots 10-15, and slot 23 torepresent a whole batch in large scale production. The remaining slotswere occupied by dummy wafers and baffle wafers (which are not used formeasurements). The unreacted material and any byproducts are pumped outusing a vacuum pump.

The data for each film deposition was summarized in Tables 2 throughTable 4. In the Tables, “ND” means not detected. After the films weredeposited, both refractive index and thickness of the dielectric filmwere measured using a Rudolph FOCUS Ellipsometer FE-IVD (RotatingCompensator Ellipsometer) by fitting the data from the film to a pre-setphysical model (e.g., the Lorentz Oscillator model). An SCI Filmtek 2000SE reflectometer was also used to verify thickness and RI due to thehighly absorbing nature of these films. Normal incidence, polarized 70degree reflection, and 70 degree spectroscopic ellipsometric data iscollected and used to calculate thickness and index of refraction of themeasured film.

Atomic composition data was collected by XPS performed on a PHI5000VersaProbe Spectrometer equipped with Multiple Channels Plates (MCD)and a focused Al monochromatic X-ray source. The low resolution surveyscan is performed at 117.4 eV Pass Energy, 1.000 eV/Step and a 50msec/step dwell time. The high resolution multiplex scans are performedat 23.50 eV Pass Energy, 0.100 eV/Step and a 100 msec/step dwell time.The analysis area is 200 microns in diameter with a take-off angle of45°. The ion gun setting is 2kV/2uA/4×4 raster. The data was collectedusing vendor supplied software; Casa XPS was used to work up the datausing transmission function corrected Area Sensitivity Factors (ASF).Thermally grown SiO₂was used as a reference and did not show any C % orN % to the detection limit of the system.

All density measurements were accomplished using X-ray reflectivity(XRR). Each sample was mounted on the vertically-oriented MaterialsResearch Diffractometer (MRD) wafer holder. XRR was performed using Cu—Kradiation as the X-ray source, the automatic Ni beam attenuator, thecopper mirror, and the 4-bounce Ge(311) crystal monochromator on theincident beam. The incident beam was also masked down to 10 mm so thatthe beam footprint would only reflect from the sample. The reflectedbeam was collimated using triple-axis optics and detected via the gasionization proportional count detector on the reflected beam. Sampleswith nominal layer thickness <200 nm were scanned using low-resolutionoptics. Samples with nominal layer thickness >200 nm were scanned usinghigh-resolution optics. Samples were scanned over the range0.2000≤2q≤0.6500 using a step size of 0.0010 and a count time of 1s/step.

Tables 2 and 3 provide the deposition results for the precursors1,4-disilabutane (1,4-DSB) and 1,4-disilapentane (1,4-DSP),respectively. The deposition results provided in Table 2 were obtainedwith no reactant being used. As Table 2 shows, good deposition rates areobtained and the high refractive index (RI) of 3 or greater isindicative of high silicon content (RI for crystalline silicon carbideis ˜2.8). Table 3 shows deposition results using 1,4-disilapentane(1,4-DSP) under similar conditions. Depositions were done with noreactant; or with N₂ or H₂ as reactants as indicated. Table 3 shows thatgood deposition rates are obtained and the refractive index is notindicative of high silicon content.

TABLE 2 Results from depositions using 1,4-disilabutane (1,4-DSB)Precursor Dep Refractive Temp Pressure Flow Reac- Rate Index (° C.)Precursor (torr) (sccm) tant (Å/min.) (632 nm) 500 1,4-DSB 1 25 None 6.83.07 550 1,4-DSB 1 25 None 51 3.59

TABLE 3 Results from depositions using 1,4-disilapentane (1,4-DSP)Precusor Dep Refractive Temp. Pressure Flow Reac- Rate Index C.Precursor (torr) (sccm) tant (Å/min.) (632 nm) 500 1,4-DSP 1 23 None 5.02.32 550 1,4-DSP 1 21 None 70 2.89 550 1,4-DSP 1 21 H₂ 75 3.04 5501,4-DSP 1 21 N₂ 68 3.03

Table 4 shows details of the film properties for depositions using1,4-DSP. At 550° C., carbon content of the films was >38% and densitywas about 2.2 g/cc or greater. The oxygen content in the films could becoming from exposure to ambient air and can be modulated by addition ofreactant or diluents. Silicon content was <52% (as measured by XPS).

TABLE 4 Results from depositions using 1,4-disilapentane (1,4-DSP) FlowDensity Condition Temp (sccm) Reactant O % C % Si % g/cc 1 550 21 N/A7.3 44.5 48.2 2.29 2 550 21 20 sccm H₂ 5.3 46.2 48.6 2.29 3 550 21 20sccm N₂ 5.8 42.4 51.9 2.33 4 550 23.3 N/A 10.7 40.5 48.7 2.20 5 500 21N/A 10.8 37.2 52.1 2.16

Fourier transform infrared spectroscopy (FTIR) spectra were measured forall samples in Table 4. The spectra generally indicated a strong Si—C—Sipeak at ˜760 cm-1; a peak at ˜1000 cm-1 (assigned to Si—CH₂—Si and alsoSi—O—Si) and a small peak at ˜2100 cm-1 (assigned to Si—H). No otherbonding was seen. Etch rate was measured by dipping the last two samplesin Table 3 in a 0.5% HF solution (1:100 ratio of 49% HF: H₂O) for 300 s.No change in film thickness was measured, showing that the films wereresistant to dilute HF etch.

Selected samples from Example 6 (Table 4, condition 1 and 3) weresubject to O₂ ashing treatment. The tool is a PVA TePla MetroLine EtcherM4L Plasma Asher Etcher (a batch-mode plasma system for etch, strip,clean, and surface treatment). The recipe was a standard baseline oxygenashing recipe to remove photoresist.

Power: 200 W He flow: 100 sccm O₂ flow: 300 sccm Pressure: 600 mTorrTime:  10 minutes

Each sample was split into two pieces: one half was treated with theoxygen ash treatment while the other sample was kept as control. Filmproperties of all samples were characterized using x-rayphotospectroscopy (XPS) and X-ray reflectivity (XRR). Tables 5 and 6below show the results from two films before and after ashing. Nomeasurable change in film RI was observed. The film thickness showedvery minor change, again within experimental error. Similarly there wasno obvious change in XPS composition (0, Si, C %) and density change waswithin experimental error.

TABLE 5 RI and thickness results of 1,4 DSP films pre and post ashingPre-ash Post ash Flow Pre ash thickness Post ash thickness Temp (sccm)Reactant RI (nm) RI (nm) 550 21 N/A 2.61 124.1 2.61 122.6 550 21 20 sccmN₂ 3.12 185.7 3.15 183.1

TABLE 6 Composition and density results of 1,4 DSP films pre and postashing. (Composition was measured after sputtering about 10 nm fromsurface) Pre-ash Post ash Flow Pre ash density Post ash density Temp(sccm) Reactant XPS % C (g/cc) XPS % C (g/cc) 550 21 N/A 39.8 2.33 39.82.35 550 21 20 sccm N₂ 39.2 2.33 39.6 2.34

1. A method for forming a silicon-based film on at least a portion ofthe surface of a substrate, the method comprising: providing at leastone surface of the substrate in a reactor; introducing at least oneorganosilicon precursor compound having the following Formulae A throughD into the reactor:

wherein X¹ and X² are each independently selected from the groupconsisting of a hydrogen atom, a halide atom, and an organoamino grouphaving the formula NR¹R² wherein R¹ is selected from the groupconsisting of a linear C₁ to C₁₀ alkyl group, a branched C₃ to C₁₀ alkylgroup, a cyclic C₃ to C₁₀ alkyl group, a linear or branched C₃ to C₁₀alkenyl group, a linear or branched C₃ to C₁₀ alkynyl group, a C₁ to C₆dialkylamino group, an electron withdrawing group, and a C₆ to C₁₀ arylgroup; R² is selected from the group consisting of a hydrogen atom, alinear C₁ to C₁₀ alkyl group, a branched C₃ to C₁₀ alkyl group, a cyclicC₃ to C₁₀ alkyl group, a linear or branched C₃ to C₆ alkenyl group, alinear or branched C₃ to C₆ alkynyl group, a C₁ to C₆ dialkylaminogroup, a C₆ to C₁₀ aryl group, a linear C₁ to C₆ fluorinated alkylgroup, a branched C₃ to C₆ fluorinated alkyl group, an electronwithdrawing group, and a C₄ to C₁₀ aryl group and optionally wherein R¹and R² are linked together to form a ring selected from a substituted orunsubstituted aromatic ring or a substituted or unsubstituted aliphaticring; R³, R⁴, and R⁵ are each independently selected from the groupconsisting of a hydrogen atom and a methyl (CH₃) group; and R⁶ isselected from the group consisting of a hydrogen atom, a linear C₁ toC₁₀ alkyl group, a branched C₃ to C₁₀ alkyl group, a cyclic C₃ to C₁₀alkyl group, a linear or branched C₃ to C₁₀ alkenyl group, a linear orbranched C₃ to C₁₀ alkynyl group, a C₁ to C₆ dialkylamino group, anelectron withdrawing group, and a C₆ to C₁₀ aryl group; and forming thesilicon-based film on the at least one surface by a deposition processselected from the group consisting of chemical vapor deposition (CVD),low pressure chemical vapor deposition (LPCVD), plasma enhanced chemicalvapor deposition (PECVD), cyclic chemical vapor deposition (CCVD),plasma enhanced cyclic chemical vapor deposition (PECCVD, atomic layerdeposition (ALD), and plasma enhanced atomic layer deposition (PEALD),wherein the silicon-based film comprises from about 0 to about 50 atomicweight percent silicon as measured by X-ray photoelectron spectroscopy(XPS).
 2. The method of claim 1 wherein the forming step is conducted atone or more temperatures ranging from about 100° C. to 650° C.
 3. Themethod of claim 1 wherein the silicon-based film is selected from thegroup consisting of a silicon carbide film, a silicon nitride film, anda silicon carbonitride film.
 4. The method of claim 1 wherein thedeposition process is LPCVD.
 5. The method of claim 1 wherein thedeposition process comprises PECVD.
 6. The method of claim 1 furthercomprising: providing a nitrogen-containing precursor and wherein aratio of the amount of the nitrogen-containing precursor to the amountof at least one organosilicon precursor ranges from 0.25 to
 1. 7. Amethod for forming a silicon-based film having the formulaSi_(x)C_(y)N_(z) wherein x is about 0 to about 55, y is about 35 toabout 100, and z is about 0 to about 50 atomic weight (wt.) percent (%)as measured by XPS on at least one surface of a substrate, the methodcomprising: providing at least one surface of the substrate in areaction chamber; introducing at least one organosilicon precursorcompound having the following Formulae A through D into the reactor:

wherein X¹ and X² are each independently selected from the groupconsisting of a hydrogen atom, a halide atom, and an organoamino grouphaving the formula NR¹R² wherein R¹ is selected from the groupconsisting of a linear C₁ to C₁₀ alkyl group, a branched C₃ to C₁₀ alkylgroup, a cyclic C₃ to C₁₀ alkyl group, a linear or branched C₃ to C₁₀alkenyl group, a linear or branched C₃ to C₁₀ alkynyl group, a C₁ to C₆dialkylamino group, an electron withdrawing group, and a C₆ to C₁₀ arylgroup; R² is selected from the group consisting of a hydrogen atom, alinear C₁ to C₁₀ alkyl group, a branched C₃ to C₁₀ alkyl group, a cyclicC₃ to C₁₀ alkyl group, a linear or branched C₃ to C₆ alkenyl group, alinear or branched C₃ to C₆ alkynyl group, a C₁ to C₆ dialkylaminogroup, a C₆ to C₁₀ aryl group, a linear C₁ to C₆ fluorinated alkylgroup, a branched C₃ to C₆ fluorinated alkyl group, an electronwithdrawing group, and a C₄ to C₁₀ aryl group, and optionally wherein R¹and R² are linked together to form a ring selected from a substituted orunsubstituted aromatic ring or a substituted or unsubstituted aliphaticring; R³, R⁴, and R⁵ are each independently selected from the groupconsisting of a hydrogen atom and a methyl (CH₃) group; and R⁶ isselected from the group consisting of a hydrogen atom, a linear C₁ toC₁₀ alkyl group, a branched C₃ to C₁₀ alkyl group, a cyclic C₃ to C₁₀alkyl group, a linear or branched C₃ to C₁₀ alkenyl group, a linear orbranched C₃ to C₁₀ alkynyl group, a C₁ to C₆ dialkylamino group, anelectron withdrawing group, and a C₆ to C₁₀ aryl group; and optionallyproviding a nitrogen-containing precursor selected from the groupconsisting of ammonia, hydrazine, monoalkylhydrazine, dialkylhydrazine,primary amine, secondary amine, tertiary amine, and mixture thereof inthe reaction chamber; and forming the silicon-based film on the at leastone surface by a deposition process comprising low pressure chemicalvapor deposition (LPCVD).
 8. The method of claim 7 wherein the at leastone silicon precursor is 1,4-disilapentane.
 9. The method of claim 7wherein the forming step is conducted at one or more temperaturesranging from about 100° C. to 650° C.
 10. The method of claim 7 whereinthe method further comprises providing a nitrogen-containing precursorand wherein a ratio of the amount of the nitrogen-containing precursorto the amount of at least one organosilicon precursor ranges from 0.25to
 20. 11. The method of claim 7 wherein the silicon-based film isselected from the group consisting of silicon carbide, silicon nitrideand silicon carbonitride.
 12. The method of claim 7 further comprisingan annealing step.
 13. A method for forming a silicon-based film on atleast one surface of a substrate, the method comprising: providing atleast one surface of the substrate in a reaction chamber; introducing atleast one organosilicon precursor compound having the following FormulaeA through D into the reactor:

wherein X¹ and X² are each independently selected from the groupconsisting of a hydrogen atom, a halide atom, and an organoamino grouphaving the formula NR¹R² wherein R¹ is selected from the groupconsisting of a linear C₁ to C₁₀ alkyl group, a branched C₃ to C₁₀ alkylgroup, a cyclic C₃ to C₁₀ alkyl group, a linear or branched C₃ to C₁₀alkenyl group, a linear or branched C₃ to C₁₀ alkynyl group, a C₁ to C₆dialkylamino group, an electron withdrawing group, and a C₆ to C₁₀ arylgroup; R² is selected from the group consisting of a hydrogen atom, alinear C₁ to C₁₀ alkyl group, a branched C₃ to C₁₀ alkyl group, a cyclicC₃ to C₁₀ alkyl group, a linear or branched C₃ to C₆ alkenyl group, alinear or branched C₃ to C₆ alkynyl group, a C₁ to C₆ dialkylaminogroup, a C₆ to C₁₀ aryl group, a linear C₁ to C₆ fluorinated alkylgroup, a branched C₃ to C₆ fluorinated alkyl group, an electronwithdrawing group, and a C₄ to C₁₀ aryl group, and optionally wherein R¹and R² are linked together to form a ring selected from a substituted orunsubstituted aromatic ring or a substituted or unsubstituted aliphaticring; R³, R⁴, and R⁵ are each independently selected from the groupconsisting of a hydrogen atom and a methyl (CH₃) group; and R⁶ isselected from the group consisting of a hydrogen atom, a linear C₁ toC₁₀ alkyl group, a branched C₃ to C₁₀ alkyl group, a cyclic C₃ to C₁₀alkyl group, a linear or branched C₃ to C₁₀ alkenyl group, a linear orbranched C₃ to C₁₀ alkynyl group, a C₁ to C₆ dialkylamino group, anelectron withdrawing group, and a C₆ to C₁₀ aryl group; optionallyproviding a nitrogen-containing precursor selected from the groupconsisting of ammonia, hydrazine, monoalkylhydrazine, dialkylhydrazine,primary amine, secondary amine, tertiary amine, and mixture thereof inthe reaction chamber; and forming the silicon-based film on the at leastone surface by a deposition process comprising plasma enhanced chemicalvapor deposition (PECVD), wherein the non-oxygen silicon-based filmcomprise from about 0 to about 50 atomic weight percent silicon asmeasured by XPS.
 14. The method of claim 13 wherein the forming step isconducted at one or more temperatures ranging from 100° C. to 650° C.15. A method for depositing a silicon-containing film selected from thegroup consisting of silicon carbide, silicon nitride and siliconcarbonitride using a deposition process selected from plasma enhancedatomic layer deposition and plasma enhanced cyclic chemical vapordeposition, the method comprising the steps of: a. placing a substrateinto a reactor which is heated to a one or more temperatures rangingfrom about 20° C. to about 400° C.; b. introducing into the reactor atleast one organosilicon precursor compound having the following FormulaeA through D:

wherein X¹ and X² are each independently selected from a hydrogen atom,a halide atom, and an organoamino group having the formula NR¹R² whereinR¹ is selected from the group consisting of a linear C₁ to C₁₀ alkylgroup, a branched C₃ to C₁₀ alkyl group, a cyclic C₃ to C₁₀ alkyl group,a linear or branched C₃ to C₁₀ alkenyl group, a linear or branched C₃ toC₁₀ alkynyl group, a C₁ to C₆ dialkylamino group, an electronwithdrawing group, and a C₆ to C₁₀ aryl group; R² is selected from thegroup consisting of a hydrogen atom, a linear C₁ to C₁₀ alkyl group, abranched C₃ to C₁₀ alkyl group, a cyclic C₃ to C₁₀ alkyl group, a linearor branched C₃ to C₆ alkenyl group, a linear or branched C₃ to C₆alkynyl group, a C₁ to C₆ dialkylamino group, a C₆ to C₁₀ aryl group, alinear C₁ to C₆ fluorinated alkyl group, a branched C₃ to C₆ fluorinatedalkyl group, an electron withdrawing group, and a C₄ to C₁₀ aryl group,and optionally wherein R¹ and R² are linked together to form a ringselected from a substituted or unsubstituted aromatic ring or asubstituted or unsubstituted aliphatic ring; R³, R⁴, and R⁵ are eachindependently selected from the group consisting of a hydrogen atom anda methyl (CH₃) group; and R⁶ is selected from the group consisting of ahydrogen atom, a linear C₁ to C₁₀ alkyl group, a branched C₃ to C₁₀alkyl group, a cyclic C₃ to C₁₀ alkyl group, a linear or branched C₃ toC₁₀ alkenyl group, a linear or branched C₃ to C₁₀ alkynyl group, a C₁ toC₆ dialkylamino group, an electron withdrawing group, and a C₆ to C₁₀aryl group; and c. purging the reactor with a purge gas; d. providing aplasma containing source into the reactor to at least partially reactwith the at least one organosilicon precursor compound and deposit thesilicon-containing film onto the substrates; and e. purging the reactorwith a purge gas. wherein the steps b through e are repeated until adesired thickness of the silicon containing film is obtained.
 16. Themethod of claim 15 wherein the plasma containing source is selected fromthe group consisting of hydrogen plasma, helium plasma, neon plasma,argon plasma, xenon plasma, hydrogen/helium plasma, hydrogen/argonplasma, nitrogen plasma, nitrogen/hydrogen, nitrogen/helium,nitrogen/argon plasma, ammonia plasma, nitrogen/ammonia plasma,ammonia/helium plasma, ammonia/argon plasma, NF₃ plasma, methylamineplasma, dimethylamine plasma, trimethylamine plasma, ethylamine plasma,diethylamine plasma, trimethylamine plasma, ethylenediamine plasma, andmixtures thereof.
 17. The method of claim 15 wherein the organosiliconprecursor is selected form the group consisting of1-chloro-1,4-disilapentane, 1-chloro-1,5-disilahexane,1,5-dichloro-1,5-disilahexane, 2,6-dichloro-2,6-disilaheptane,1-dimethylamino-1,4-disilapentane, 1-diethylamino-1,4-disilapentane,1-di-iso-propylamino-1,4-disilapentane,1-dimethylamino-1,5-disilahexane, 1-diethylamino-1,5-disilahexane,1-di-iso-propylamino-1,5-disilahexane, 2-dimethylamino-2,5-disilahexane,2-diethylamino-2,5-disilahexane, 2-di-iso-propylamino-2,5-disilahexane,2-dimethylamino-2,6-disilaheptane, 2-diethylamino-2,6-disilaheptane,2-di-iso-propylamino-2,6-disilaheptane,1,4-bis(dimethylamino)-1,4-disilapentane,1 ,4-bis(diethylamino)-1,4-disilapentane,1,5-bis(dimethylamino)-1,5-disilahexane,1,5-bis(diethylamino)-1,5-disilahexane,2,5-bis(dimethylamino)-2,5-disilahexane,2,5-bis(diethylamino)-2,5-disilahexane,2,6-bis(dimethylamino)-2,6-disilaheptane,2,6-bis(diethylamino)-2,6-disilaheptane,1,2-dimethyl-1-aza-2,5-disilacyclopentane,1-n-propyl-2-methyl-1-aza-2,5-disilacyclopentane,1-iso-propyl-2-methyl-1-aza-2,5-disilacyclopentane,1-tert-butyl-2-methyl-1-aza-2,5-disilacyclopentane,1,2-dimethyl-1-aza-2,6-disilacyclohexane,1-n-propyl-2-methyl-1-aza-2,6-disilacyclohexane,1-iso-propyl-2-methyl-1-aza-2,6-disilacyclohexane,1-tert-butyl-2-methyl-1-aza-2,5-disilacyclohexane,1,2,5-trimethyl-1-aza-2,5-disilacyclopentane,1-n-propyl-2,5-dimethyl-1-aza-2,5-disilacyclopentane,1-iso-propyl-2,5-dimethyl-1-aza-2,5-disilacyclopentane,1-tert-butyl-2,5-dimethyl-1-aza-2,5-disilacyclopentane,1,2,6-trimethyl-1-aza-2,6-disilacyclohexane,1-n-propyl-2,6-dimethyl-1-aza-2,6-disilacyclohexane,1-iso-propyl-2,6-dimethyl-1-aza-2,6-disilacyclohexane, and1-tert-butyl-2,6-dimethyl-1-aza-2,6-disilacyclohexane.
 18. The method ofclaim 1 wherein the method is an atomic layer deposition method.
 19. Themethod of claim 1 wherein the method is a plasma enhanced atomic layerdeposition method.
 20. A composition for vapor deposition of asilicon-based film; the composition comprising: at least oneorganosilicon precursor comprising two silicon atoms selected from thegroup consisting of 1-chloro-1,4-disilapentane,1-chloro-1,5-disilahexane, 1,5-dichloro-1,5-disilahexane,2,6-dichloro-2,6-disilaheptane, 1-dimethylamino-1,5-disilahexane,1-diethylamino-1,5-disilahexane, 1-di-iso-propylamino-1,5-disilahexane,2-dimethylamino-2,5-disilahexane, 2-diethylamino-2,5-disilahexane,2-di-iso-propylamino-2,5-disilahexane,2-dimethylamino-2,6-disilaheptane, 2-diethylamino-2,6-disilaheptane,2-di-iso-propylamino-2,6-disilaheptane,1,4-bis(dimethylamino)-1,4-disilapentane,1,4-bis(diethylamino)-1,4-disilapentane,1,5-bis(dimethylamino)-1,5-disilahexane,1,5-bis(diethylamino)-1,5-disilahexane,2,5-bis(dimethylamino)-2,5-disilahexane,2,5-bis(diethylamino)-2,5-disilahexane,2,6-bis(dimethylamino)-2,6-disilaheptane,2,6-bis(diethylamino)-2,6-disilaheptane,1,2-dimethyl-1-aza-2,5-disilacyclopentane,1-n-propyl-2-methyl-1-aza-2,5-disilacyclopentane,1-iso-propyl-2-methyl-1-aza-2,5-disilacyclopentane,1-tert-butyl-2-methyl-1-aza-2,5-disilacyclopentane,1,2-dimethyl-1-aza-2,6-disilacyclohexane,1-n-propyl-2-methyl-1-aza-2,6-disilacyclohexane,1-iso-propyl-2-methyl-1-aza-2,6-disilacyclohexane,1-tert-butyl-2-methyl-1-aza-2,5-disilacyclohexane, 1,2,5-trimethyl-1-aza-2,5-disilacyclopentane,1-n-propyl-2,5-dimethyl-1-aza-2,5-disilacyclopentane,1-iso-propyl-2,5-dimethyl-1-aza-2,5-disilacyclopentane,1-tert-butyl-2,5-dimethyl-1-aza-2,5-disilacyclopentane,1,2,6-trimethyl-1-aza-2,6-disilacyclohexane,1-n-propyl-2,6-dimethyl-1-aza-2,6-disilacyclohexane,1-iso-propyl-2,6-dimethyl-1-aza-2,6-disilacyclohexane, and1-tert-butyl-2,6-dimethyl-1-aza-2,6-disilacyclohexane.